• DocumentCode
    1902394
  • Title

    ESD defect localisation using photovoltaic laser stimulation techniques: optimization and interpretation

  • Author

    Beauchêne, T. ; Lewis, D. ; Perdu, P. ; Beaudoin, F. ; Fouillat, P. ; Touboul, A.

  • Author_Institution
    Lab. IXL, Bordeaux, France
  • fYear
    2003
  • fDate
    7-11 July 2003
  • Firstpage
    179
  • Lastpage
    182
  • Abstract
    Alternative localization techniques to classical methods such as liquid crystal or photoemission microscopes (PEM) are studied. The aim of this article is to illustrate the suitability of Optical Beam Induced Current (OBIC) methods to accurately localize and analyze ESD defects, and to provide a global OBIC methodology.
  • Keywords
    OBIC; electrostatic discharge; laser theory; photovoltaic cells; ESD defect localisation; OBIC; interpretation; optical beam induced current; optimization; photovoltaic laser stimulation; Circuit testing; Electrostatic discharge; Leakage current; Liquid crystals; Optical amplifiers; Optical pulses; Photovoltaic systems; Protection; Pulse amplifiers; Solar power generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physical and Failure Analysis of Integrated Circuits, 2003. IPFA 2003. Proceedings of the 10th International Symposium on the
  • Print_ISBN
    0-7803-7722-2
  • Type

    conf

  • DOI
    10.1109/IPFA.2003.1222761
  • Filename
    1222761
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1902394