Title :
Shortfall-Risk Minimizing Hedging Based on MCMC Method
Author :
Guo Jian-Hua ; Xiao Qing-xian
Author_Institution :
Bus. Sch., Univ. of Shanghai for Sci. & Technol., Shanghai, China
Abstract :
Many researchers have studied the multi-period shortfall-risk minimizing hedging problem under jump-diffusion settings, however, up to now, there has not been many literatures to directly present the analytic solution for such a hedging problem. In this paper, defining the terminal shortfall as hedging risk, we research the minimal shortfall-risk hedging problem of European option by means of MCMC method. Firstly, we look on the underlying asset´s positions held at each strategy rebalancing moment during option´s maturity as a random vector; then, we aptly construct this random vector´s conditional joint probability density function, from which we sample a Markov chain, according to the Bayes principle and Ergodic theorem, the drawn Markov chain will congregate around the optimal strategy with higher probability and converge to it, thus, it´s reasonable to substitute the optimal hedging position with the averaged value of this Markov chain; finally, experimental analysis results illustrate that our method is not only feasible but convenient to manipulate while being helpful and referential to hedging practice.
Keywords :
Bayes methods; Markov processes; Monte Carlo methods; finance; risk management; statistical mechanics; Bayes principle; Ergodic theorem; European option; MCMC method; Markov chain Monte Carlo method; conditional joint probability density function; jump diffusion setting; minimal shortfall risk hedging problem; multiperiod shortfall risk minimizing hedging problem; optimal hedging position; random vector; strategy rebalancing moment; Economic indicators; Europe; Finance; Indexes; Markov processes; Probability density function; Security;
Conference_Titel :
Information Engineering and Computer Science (ICIECS), 2010 2nd International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-7939-9
Electronic_ISBN :
2156-7379
DOI :
10.1109/ICIECS.2010.5678409