DocumentCode :
1902472
Title :
Ultrasonic Nondestructive Testing Signal Measuring and Processing System Based on VC++
Author :
Jingrui, Wang ; Xiaoqin, Lian ; Xiaoli, Zhang ; Dingguo, Xiao ; Chunguang, Xu
Author_Institution :
Coll. of Compute & Inf. Eng., Beijing Technol. & Bus. Univ., Beijing, China
Volume :
3
fYear :
2012
fDate :
23-25 March 2012
Firstpage :
183
Lastpage :
186
Abstract :
In order to improve the reliability and accuracy in using ultrasonic flaw detector, this paper designed a system for detecting the flaw detector performance parameters of the transmitter, to achieve the testing and calibration of parameters for detector output characteristics of the transmitter. The core of the system is the IPC, using acquisition card PCI-5124 to collect output signal of detector´s transmitter. Based on VC++, this paper designed interface of output parameters for detector´s transmitter, achieved the design of driver of acquisition card better and the design of detection algorithm has various parameters. Calibration results show that: the system completed testing and calibration parameters better, such as the pulse peak, pulse rise time and duration, pulse repetition frequency, center frequency and bandwidth, the equivalent output impedance transmitter.
Keywords :
C++ language; calibration; data acquisition; flaw detection; measurement systems; ultrasonic materials testing; virtual instrumentation; IPC; VC++; acquisition card PCI-5124; calibration parameters; center bandwidth; center frequency; detector transmitter; equivalent output impedance transmitter; pulse peak; pulse repetition frequency; pulse rise duration; pulse rise time; ultrasonic flaw detector performance parameter; ultrasonic nondestructive testing signal measuring system; ultrasonic nondestructive testing signal processing system; Acoustics; Calibration; Data acquisition; Detectors; Frequency measurement; Testing; Ultrasonic variables measurement; Characteristic Testing; High-speed Data Acquisition; Ultrasonic Testing; Virtual Instrument;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Science and Electronics Engineering (ICCSEE), 2012 International Conference on
Conference_Location :
Hangzhou
Print_ISBN :
978-1-4673-0689-8
Type :
conf
DOI :
10.1109/ICCSEE.2012.447
Filename :
6188194
Link To Document :
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