Title :
Dynamic latchup study using transmission line pulses and picosecond imaging circuit analysis [CMOS IC latchup]
Author :
Stellari, Franco ; Weger, Alan J. ; Song, Peilin ; McManus, Moyra K.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
In this work, we present a methodology based on the combination of transmission line pulse (TLP) stimulation and picosecond imaging circuit analysis (PICA) for studying the dynamic onset of latchup. A mathematical model, based on carrier recombination equations, is also discussed and is shown to be in very good agreement with experimental data.
Keywords :
CMOS integrated circuits; electron-hole recombination; integrated circuit measurement; integrated circuit modelling; CMOS IC dynamic latchup; PICA; TLP; carrier recombination equations; latchup dynamic onset; parasitic bipolar transistors; picosecond imaging circuit analysis; transmission line pulse stimulation; Bipolar transistors; CMOS technology; Circuit analysis; Circuit testing; Distributed parameter circuits; Electrostatic discharge; Power transmission lines; Pulse circuits; Substrates; Thyristors;
Conference_Titel :
Solid-State Device Research conference, 2004. ESSDERC 2004. Proceeding of the 34th European
Print_ISBN :
0-7803-8478-4
DOI :
10.1109/ESSDER.2004.1356525
