DocumentCode
1902651
Title
Dynamic latchup study using transmission line pulses and picosecond imaging circuit analysis [CMOS IC latchup]
Author
Stellari, Franco ; Weger, Alan J. ; Song, Peilin ; McManus, Moyra K.
Author_Institution
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fYear
2004
fDate
21-23 Sept. 2004
Firstpage
205
Lastpage
208
Abstract
In this work, we present a methodology based on the combination of transmission line pulse (TLP) stimulation and picosecond imaging circuit analysis (PICA) for studying the dynamic onset of latchup. A mathematical model, based on carrier recombination equations, is also discussed and is shown to be in very good agreement with experimental data.
Keywords
CMOS integrated circuits; electron-hole recombination; integrated circuit measurement; integrated circuit modelling; CMOS IC dynamic latchup; PICA; TLP; carrier recombination equations; latchup dynamic onset; parasitic bipolar transistors; picosecond imaging circuit analysis; transmission line pulse stimulation; Bipolar transistors; CMOS technology; Circuit analysis; Circuit testing; Distributed parameter circuits; Electrostatic discharge; Power transmission lines; Pulse circuits; Substrates; Thyristors;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Device Research conference, 2004. ESSDERC 2004. Proceeding of the 34th European
Print_ISBN
0-7803-8478-4
Type
conf
DOI
10.1109/ESSDER.2004.1356525
Filename
1356525
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