DocumentCode :
1902722
Title :
Enabling high-performance mixed-signal system-on-a-chip (SoC) in high performance logic CMOS technology
Author :
Franca-Neto, L.M. ; Pardy, P. ; Ly, M.P. ; Rangel, R. ; Suthar, S. ; Syed, T. ; Bloechel, B. ; Lee, S. ; Burnett, C. ; Cho, D. ; Kau, D. ; Fazio, A. ; Soumyanath, K.
Author_Institution :
Intel Labs, Hillsboro, OR, USA
fYear :
2002
fDate :
13-15 June 2002
Firstpage :
164
Lastpage :
167
Abstract :
Presents a technique to enable the integration of sensitive analog circuits with a Pentium class microprocessor, on a lossy substrate that sees 190 mVrms of equivalent noise at the center of the die. Measurement results of substrate noise on a Pentium 4/spl reg/ 1 GHz processor show that we can exploit the spectral content of this noise, and use appropriately tuned analog amplification to limit the isolation requirements to 70 dB. By using a combination of measurement and field solver results, we show that a minimal process enhancement (i.e. a deep nwell) will yield 50 dB of isolation. We use measured mismatch data and analysis to conclude that the remaining 20 dB can be achieved by symmetric matched layouts and fully differential circuit topologies. We describe two deep nwell biasing techniques (substrate noise trapping and floating deep nwell) to realize the 50 dB on-die isolation. Finally, we use measurements to show that the deep nwell does not adversely impact the high frequency performance of 140 nm logic CMOS devices.
Keywords :
CMOS integrated circuits; VLSI; differential amplifiers; integrated circuit noise; isolation technology; mixed analogue-digital integrated circuits; 1 GHz; 140 nm; appropriately tuned analog amplification; deep nwell biasing techniques; field solver results; floating deep nwell; fully differential circuit topologies; high frequency performance; isolation requirements; logic CMOS technology; lossy substrate; mismatch data; mixed-signal system-on-a-chip; process enhancement; substrate noise; substrate noise trapping; symmetric matched layouts; Analog circuits; CMOS logic circuits; CMOS technology; Circuit noise; Circuit topology; Data analysis; Integrated circuit measurements; Microprocessors; Noise measurement; System-on-a-chip;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Circuits Digest of Technical Papers, 2002. Symposium on
Conference_Location :
Honolulu, HI, USA
Print_ISBN :
0-7803-7310-3
Type :
conf
DOI :
10.1109/VLSIC.2002.1015074
Filename :
1015074
Link To Document :
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