• DocumentCode
    1902745
  • Title

    CMOS-compatible vertical MOSFETs and logic gates with reduced parasitic capacitance

  • Author

    Kunz, V.D. ; de Groot, C.H. ; Gili, E. ; Uchino, T. ; Hall, S. ; Ashburn, P.

  • Author_Institution
    Dept. of Electron. & Comput. Sci., Southampton Univ., UK
  • fYear
    2004
  • fDate
    21-23 Sept. 2004
  • Firstpage
    221
  • Lastpage
    224
  • Abstract
    This paper reports electrical results on CMOS-compatible vertical transistors and logic gates with reduced overlap capacitance. It is shown that surround-gate MOSFETs, produced using the fillet local oxidation process (FILOX), have lower gate/drain overlap capacitance and consume less silicon area than comparable lateral MOSFETs. Novel logic gate structures, based on partially removing the polysilicon surround gate, are described and characterised.
  • Keywords
    MOSFET; logic gates; oxidation; CMOS logic gates; CMOS-compatible MOSFET; FILOX; NAND gates; NOR gates; fillet local oxidation process; gate/drain overlap capacitance; overlap capacitance reduction; parasitic capacitance reduction; polysilicon surround gate partial removal; surround-gate MOSFET; vertical MOSFET; Computer science; Epitaxial growth; Etching; Fabrication; Lithography; Logic devices; Logic gates; MOSFETs; Parasitic capacitance; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research conference, 2004. ESSDERC 2004. Proceeding of the 34th European
  • Print_ISBN
    0-7803-8478-4
  • Type

    conf

  • DOI
    10.1109/ESSDER.2004.1356529
  • Filename
    1356529