DocumentCode :
190317
Title :
Speed optimized large area avalanche photodetector in standard CMOS technology for visible light communication
Author :
Ray, Sagar ; Hella, Mona M. ; Hossain, Md Mottaleb ; Zarkesh-Ha, Payman ; Hayat, Majeed M.
Author_Institution :
Dept. of Electr., Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
fYear :
2014
fDate :
2-5 Nov. 2014
Firstpage :
2147
Lastpage :
2150
Abstract :
This paper presents a speed-optimized large area avalanche photodetector (APD) in standard CMOS technology for visible light communication applications (VLC). Recent research efforts have reported high speed CMOS APDs with low breakdown voltage for considerably small photodiode sizes, which limits the APD usage in low cost optical receivers for VLC. The speed of a large-area APD dramatically decreases due to increased transit time of diffusive carriers in charge neutral regions. The proposed technique divides the active area into multiple sub-sections to decrease transit time and increase speed. A prototype 350×350 μm2 APD is fabricated in 0.13-μm CMOS technology. The photodetector achieves a maximum gain of 7.6 K at 11 V reverse bias, showing excellent agreement with simulation results as calculated using the nonlocal impact ionization model based on recursive dead-space multiplication theory (DSMT). 2-D device level simulations validate the speed enhancement by comparing the small signal simulation results of three P+/N-well photodiodes with the same area detector composed of different number of sub-sections.
Keywords :
CMOS integrated circuits; avalanche photodiodes; impact ionisation; photodetectors; semiconductor device breakdown; semiconductor device models; 2D device level simulations; breakdown voltage; nonlocal impact ionization model; p-n well photodiodes; recursive dead-space multiplication theory; size 0.13 mum; speed enhancement; speed-optimized large area avalanche photodetector; standard CMOS technology; visible light communication applications; voltage 11 V; Avalanche photodiodes; CMOS integrated circuits; CMOS technology; Junctions; Noise; Optical receivers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
SENSORS, 2014 IEEE
Conference_Location :
Valencia
Type :
conf
DOI :
10.1109/ICSENS.2014.6985463
Filename :
6985463
Link To Document :
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