• DocumentCode
    1903295
  • Title

    SiC Growth and Its Application to High-Speed Si-HBTs

  • Author

    Sugii, T. ; Yamazaki, T. ; Arimoto, Y. ; Ito, T. ; Furumura, Y. ; Namura, I. ; Goto, H. ; Tahara, A.

  • Author_Institution
    Fujitsu Laboratories Ltd., 10-1 Morinosato-Wakamiya, Atsugi 243-01, Japan
  • fYear
    1992
  • fDate
    14-17 Sept. 1992
  • Firstpage
    335
  • Lastpage
    342
  • Abstract
    This paper discusses the limitations of a conventional poly-Si emitter for sub 0.5¿m bipolar transistors and presents a breakthrough using a heterojunction at the emitter-base junction with an SiCx widegap emitter. Both SiCx widegap emitter HBTs and poly-Si emitter transistors with comparable device structures are examined. Low base resistance was achieved using a 1×1019/cm3 base dopant concentration, while retaining an acceptable current gain and suppressing forward-bias tunneling current using the SiCx emitter. A very thin , highly doped base was combined with the SiCx emitter to demonstrate high-speed capability.
  • Keywords
    Bipolar transistors; Cutoff frequency; Degradation; Delay effects; Heterojunction bipolar transistors; Laboratories; Material storage; Microelectronics; Silicon carbide; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1992. ESSDERC '92. 22nd European
  • Conference_Location
    Leuven, Belgium
  • Print_ISBN
    0444894780
  • Type

    conf

  • Filename
    5435113