• DocumentCode
    1903326
  • Title

    Delay fault testability modeling with temporal logic

  • Author

    Westerman, G. ; Heath, J.R. ; Stroud, C.E.

  • Author_Institution
    Lexmark Int. Inc., Lexington, KY
  • fYear
    1997
  • fDate
    22-25 Sep 1997
  • Firstpage
    376
  • Lastpage
    382
  • Abstract
    To ensure the quality of manufactured integrated circuits, it is important that designs be delay fault testable. A formal verification technique such as temporal logic can help avoid the large cost of dynamic simulation. Temporal logic is a formalism for evaluating the temporal behavior of systems. STeP, Stanford Temporal Prover, is a system developed at Stanford University to support computer-aided formal verification of concurrent and reactive systems based on temporal logic specification. The application of temporal logic and STeP to delay fault testability modeling and analysis is presented
  • Keywords
    delays; design for testability; formal verification; integrated circuit modelling; integrated logic circuits; logic testing; temporal logic; STeP; Stanford Temporal Prover; computer-aided formal verification; concurrent and reactive systems; cost; delay fault testability modeling; dynamic simulation; fault testability analysis; fault testability modeling; formal verification; manufactured integrated circuits; reactive systems; temporal logic; temporal logic specification; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Costs; Delay; Formal verification; Integrated circuit manufacture; Integrated circuit testing; Logic testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    0-7803-4162-7
  • Type

    conf

  • DOI
    10.1109/AUTEST.1997.633648
  • Filename
    633648