DocumentCode
1903326
Title
Delay fault testability modeling with temporal logic
Author
Westerman, G. ; Heath, J.R. ; Stroud, C.E.
Author_Institution
Lexmark Int. Inc., Lexington, KY
fYear
1997
fDate
22-25 Sep 1997
Firstpage
376
Lastpage
382
Abstract
To ensure the quality of manufactured integrated circuits, it is important that designs be delay fault testable. A formal verification technique such as temporal logic can help avoid the large cost of dynamic simulation. Temporal logic is a formalism for evaluating the temporal behavior of systems. STeP, Stanford Temporal Prover, is a system developed at Stanford University to support computer-aided formal verification of concurrent and reactive systems based on temporal logic specification. The application of temporal logic and STeP to delay fault testability modeling and analysis is presented
Keywords
delays; design for testability; formal verification; integrated circuit modelling; integrated logic circuits; logic testing; temporal logic; STeP; Stanford Temporal Prover; computer-aided formal verification; concurrent and reactive systems; cost; delay fault testability modeling; dynamic simulation; fault testability analysis; fault testability modeling; formal verification; manufactured integrated circuits; reactive systems; temporal logic; temporal logic specification; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Costs; Delay; Formal verification; Integrated circuit manufacture; Integrated circuit testing; Logic testing;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings
Conference_Location
Anaheim, CA
Print_ISBN
0-7803-4162-7
Type
conf
DOI
10.1109/AUTEST.1997.633648
Filename
633648
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