• DocumentCode
    1903333
  • Title

    Extending VLSI design with higher-order logic

  • Author

    Chavan, Anand ; Chin, Shiu-Kai ; Ikram, Shahid ; Kim, Jang Dae ; Juin-Yeu Zu

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Syracuse Univ., NY, USA
  • fYear
    1995
  • fDate
    2-4 Oct 1995
  • Firstpage
    85
  • Lastpage
    94
  • Abstract
    Extending VLSI CAD with higher-order logic integrates formal verification with synthesis. The benefits of doing so are: 1) relating instruction-set descriptions to implementations, 2) designing at a higher level of abstraction than at the level of schematics, 3) verifying by proof 4) reusing verified parameterized designs, 5) automatically compiling designs in higher-order logic to parameterized cell generators and layouts, and 6) validating electrical and functional properties by simulation. Such an integration is demonstrated by linking the Cambridge Higher-Order Logic (HOL) theorem-prover with the Mentor Graphics GDT design environment. We illustrate its applications by creating a parameterized macro-cell generator for an n-bit Am2910 microprogram sequencer whose design is formally verified with respect to its instruction-set architecture specification
  • Keywords
    VLSI; formal verification; logic CAD; logic design; logic testing; theorem proving; Am2910; Cambridge Higher-Order Logic theorem-prover; VLSI CAD; VLSI design; design environment; formal verification; higher-order logic; instruction-set architecture; microprogram sequencer; theorem-prover; Automatic logic units; Design automation; Formal verification; Gas discharge devices; Graphics; Joining processes; Logic design; Process design; Product development; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design: VLSI in Computers and Processors, 1995. ICCD '95. Proceedings., 1995 IEEE International Conference on
  • Conference_Location
    Austin, TX
  • ISSN
    1063-6404
  • Print_ISBN
    0-8186-7165-3
  • Type

    conf

  • DOI
    10.1109/ICCD.1995.528795
  • Filename
    528795