• DocumentCode
    1903515
  • Title

    Summary and applicability of analog fault detection/isolation techniques

  • Author

    Molnar, Joseph A.

  • Author_Institution
    Syst. Instrum. & Integration Sect., Naval Res. Lab., Washington, DC, USA
  • fYear
    1997
  • fDate
    22-25 Sep 1997
  • Firstpage
    383
  • Lastpage
    389
  • Abstract
    A survey of common analog fault diagnostic techniques is provided. The focus is on providing information to facilitate the use of viable techniques suited for a problem definition. The level of understanding of the analog system is correlated with the type of techniques best suited for the diagnostic system. Reviewed are techniques from Control Theory, Probability Theory, Computational Expert Systems, and Computational Artificial intelligence. The Control Theory techniques are suited best for system diagnostic problems where the system model is accurately understood. Techniques that employ Probability Theory are valuable for addressing uncertainty that arises in diagnostics of systems affected by noise. Computational Expert Systems address the problem of diagnostics by creating a data situations where the diagnostic process is accurately understood. Computational Artificial Intelligence techniques are presented as being best suited for systems where little reliable knowledge is known. The analysis does not preclude the use of any technique, but rather addresses efficiency of application
  • Keywords
    Bayes methods; Kalman filters; analogue circuits; artificial intelligence; diagnostic expert systems; fault diagnosis; fault location; neural nets; probability; Bayesian classification; Kalman filters; analog fault detection/isolation; analog fault diagnostic techniques; computational artificial intelligence; computational expert systems; control theory; nearest neighbor classification; neural nets; noise; probability theory; system model; uncertainty; Artificial intelligence; Control theory; Diagnostic expert systems; Equations; Fault detection; Filters; Instruments; Laboratories; Power system modeling; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    0-7803-4162-7
  • Type

    conf

  • DOI
    10.1109/AUTEST.1997.633649
  • Filename
    633649