Title :
Effectiveness of adaptive supply voltage and body bias for reducing impact of parameter variations in low power and high performance microprocessors
Author :
Tschanz, J. ; Narendra, S. ; Nair, R. ; De, V.
Author_Institution :
Microprocessor Res., Intel Labs., Hillsboro, OR, USA
Abstract :
Test chip measurements show that adaptive V/sub CC/ is useful for reducing impacts of parameter variations on frequency, active power and leakage power of microprocessors. Using adaptive V/sub CC/ together with adaptive V/sub BS/ or WID-V/sub BS/ is much more effective than using any of them individually.
Keywords :
integrated circuit measurement; leakage currents; low-power electronics; microprocessor chips; network parameters; active power; adaptive supply voltage; body bias; high performance microprocessors; leakage power; low power microprocessors; parameter variations; test chip measurements; CMOS technology; Capacitance; Circuit testing; Clocks; Frequency measurement; MOS devices; Microprocessors; Power measurement; Video recording; Voltage;
Conference_Titel :
VLSI Circuits Digest of Technical Papers, 2002. Symposium on
Conference_Location :
Honolulu, HI, USA
Print_ISBN :
0-7803-7310-3
DOI :
10.1109/VLSIC.2002.1015112
