• DocumentCode
    1904016
  • Title

    Analysis and application of energy capability characterization methods in power MOSFETs

  • Author

    Van den Bosch, G. ; Moens, P. ; Gassot, P. ; Wojciechowski, D. ; Groeseneken, G.

  • Author_Institution
    IMEC, Leuven, Belgium
  • fYear
    2004
  • fDate
    21-23 Sept. 2004
  • Firstpage
    453
  • Lastpage
    456
  • Abstract
    A theoretical and experimental comparison is made between different energy capability (EC) characterization methods in power MOSFETs. In traditional clamped inductive switching (CIS) the measurement conditions are difficult to control independently. Moreover, theoretical analysis suggests that the CIS results are not unique but depend on measurement circuit parameters. An alternative method uses rectangular power pulses. Various implementations have been considered and the resulting energy capability data have been shown to match well with one another and with the CIS data. The influence on EC of a thick Cu layer covering the power transistor is demonstrated.
  • Keywords
    copper; failure analysis; power MOSFET; power measurement; semiconductor device measurement; semiconductor device reliability; C; CIS; clamped inductive switching; energy capability characterization methods; power MOSFET; power transistor thick Cu covering layer; rectangular power pulses; thermal failure models; Circuits; Computational Intelligence Society; MOSFETs; Power measurement; Pulse measurements; Pulse shaping methods; Semiconductor optical amplifiers; Shape; Switches; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Device Research conference, 2004. ESSDERC 2004. Proceeding of the 34th European
  • Print_ISBN
    0-7803-8478-4
  • Type

    conf

  • DOI
    10.1109/ESSDER.2004.1356589
  • Filename
    1356589