• DocumentCode
    1904128
  • Title

    Impact of Nanocrystal Size on NVM Array Reliability Performance

  • Author

    Gasquet, Horacio P. ; Steimle, Robert F. ; Rao, Rajesh A. ; Muralidhar, Ramachandran

  • fYear
    2006
  • fDate
    2006
  • Firstpage
    64
  • Lastpage
    65
  • Keywords
    Dielectric losses; Dielectric measurements; Electron traps; Histograms; Nanocrystals; Nonvolatile memory; Size control; Size measurement; Testing; Thickness control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Non-Volatile Semiconductor Memory Workshop, 2006. IEEE NVSMW 2006. 21st
  • Conference_Location
    Monterey, CA, USA
  • Print_ISBN
    1-4244-0027-9
  • Type

    conf

  • DOI
    10.1109/.2006.1629496
  • Filename
    1629496
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1904128