Title :
Impact of Nanocrystal Size on NVM Array Reliability Performance
Author :
Gasquet, Horacio P. ; Steimle, Robert F. ; Rao, Rajesh A. ; Muralidhar, Ramachandran
Keywords :
Dielectric losses; Dielectric measurements; Electron traps; Histograms; Nanocrystals; Nonvolatile memory; Size control; Size measurement; Testing; Thickness control;
Conference_Titel :
Non-Volatile Semiconductor Memory Workshop, 2006. IEEE NVSMW 2006. 21st
Conference_Location :
Monterey, CA, USA
Print_ISBN :
1-4244-0027-9
DOI :
10.1109/.2006.1629496
