• DocumentCode
    1904167
  • Title

    Zero Defects - Reliability for Automotive Electronics

  • Author

    von Tils, Valentin

  • Author_Institution
    Robert Bosch GmbH, D-72703 Reutlingen, Germany, P.O.Box 14342
  • fYear
    2008
  • fDate
    1-4 June 2008
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    As complexity in automotive semiconductor applications is increasing, the need for robust and failure free semiconductors is increasing even more. This paper addresses the special requirements of automotive applications. The operating conditions of semiconductors in a car will be shown. The differences to other challenging semiconductor applications will be pointed out. It shows, that automotive application is not the worst environment in a particular field but a combination of several hard conditions. The need to strive for zero failures will be derived by an example of a typical electronic control unit. Trends in automotive electronics will show that the operating conditions for semiconductors in a car will get even worse in the future. It will be shown, that dealing with aging mechanisms and end of life calculations will become mandatory.
  • Keywords
    Actuators; Automotive applications; Automotive electronics; Circuits; Costs; ISO standards; Microelectronics; Redundancy; Safety devices; Vehicles;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Interconnect Technology Conference, 2008. IITC 2008. International
  • Conference_Location
    Burlingame, CA, USA
  • Print_ISBN
    978-1-4244-1911-1
  • Electronic_ISBN
    978-1-4244-1912-8
  • Type

    conf

  • DOI
    10.1109/IITC.2008.4546908
  • Filename
    4546908