Title :
Three-Dimensional Integration Technology Using Self-Assembly Technique and Super-Chip Integration
Author :
Koyanagi, Mitsumasa ; Fukushima, Takafumi ; Tanaka, Tetsu
Author_Institution :
Department of Bioengineering and Robotics, Tohoku University, 6-6-01 Aza-Aoba, Aramaki, Aoba-ku, Sendai 980-8579, Japan
Abstract :
We have proposed a new three-dimensional (3-D) integration technology based on multichip-to-wafer bonding called a super-chip integration. Many chips are simultaneously aligned and bonded onto lower chips using a self-assembly technique in a super-chip integration. It was confirmed that Si chips with sizes of 1 mm square to 5 mm square were precisely assembled on Si wafers with high alignment accuracy of less than 0.5¿m. We have fabricated 3-D LSI test chips by a super-chip integration technology.
Keywords :
Assembly; Biomedical engineering; Capacitance; Large scale integration; Robots; Self-assembly; Testing; Through-silicon vias; Wafer bonding; Wiring; Three-dimensional (3-D) LSI; chip-to-wafer bonding; self-assembly; super-chip; through-silicon-via (TSV);
Conference_Titel :
Interconnect Technology Conference, 2008. IITC 2008. International
Conference_Location :
Burlingame, CA, USA
Print_ISBN :
978-1-4244-1911-1
Electronic_ISBN :
978-1-4244-1912-8
DOI :
10.1109/IITC.2008.4546910