DocumentCode :
1904206
Title :
A 3D-IC Technology with Integrated Microchannel Cooling
Author :
Sekar, Deepak ; King, Calvin ; Dang, Bing ; Spencer, Todd ; Thacker, Hiren ; Joseph, Paul ; Bakir, Muhannad ; Meindl, James
Author_Institution :
Georgia Institute of Technology
fYear :
2008
fDate :
1-4 June 2008
Firstpage :
13
Lastpage :
15
Abstract :
A 3D-IC technology with integrated microchannel cooling is demonstrated in this paper. Fluidic interconnect network fabrication proceeds at the wafer-level, is compatible with CMOS processing and flip-chip assembly and requires four lithography steps. Measurements for single chips prior to 3D stacking reveal that each die in a two chip 3D stack may potentially exhibit a junction-to-ambient thermal resistance of 0.24??C/W. The demonstrated silicon die contain a through-silicon copper via density of 2500/cm2 integrated within the microchannel heat sink.
Keywords :
Assembly; CMOS process; CMOS technology; Cooling; Density measurement; Fabrication; Lithography; Microchannel; Thermal resistance; Three-dimensional integrated circuits;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Interconnect Technology Conference, 2008. IITC 2008. International
Conference_Location :
Burlingame, CA, USA
Print_ISBN :
978-1-4244-1911-1
Type :
conf
DOI :
10.1109/IITC.2008.4546911
Filename :
4546911
Link To Document :
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