• DocumentCode
    1904219
  • Title

    TWIn SONOS TransistOR (TWISTOR) for 2-bit/cell SONOS Memory Technology

  • Author

    Choi, Byung Yong ; Park, Byung-Gook ; Lee, Jong Duk ; Shin, Hyungcheol ; Lee, Yong Kyu ; Sung, Suk-Kang ; Lee, Se-Hoon ; Chae, Heesoon ; Lee, Jong Jin ; Bai, Keun Hee ; Kim, Dong-Dae ; Kim, Dong-Won ; Lee, Choong-Ho ; Park, Donggun

  • Author_Institution
    ISRC & Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ.
  • fYear
    2006
  • fDate
    12-16 Feb. 2006
  • Firstpage
    72
  • Lastpage
    73
  • Abstract
    In terms of nonvolatile memory device characteristics, the optimal device parameters for the TWISTOR (twin SONOS transistor) structure are investigated. Through this study, we show the best performance of 80nm gate TWISTOR device, which are very promising solution of future 2-bit/cell SONOS technology
  • Keywords
    integrated memory circuits; semiconductor-insulator-semiconductor devices; 2 bit; 2 bit/cell SONOS memory technology; 80 nm; TWISTOR structure; nonvolatile memory device; optimal device parameters; twin SONOS transistor; Channel hot electron injection; Computer science; Electronic equipment testing; Hot carriers; Nonvolatile memory; Research and development; SONOS devices; Scalability; Semiconductor device testing; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Non-Volatile Semiconductor Memory Workshop, 2006. IEEE NVSMW 2006. 21st
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    1-4244-0027-9
  • Type

    conf

  • DOI
    10.1109/.2006.1629500
  • Filename
    1629500