Title :
TWIn SONOS TransistOR (TWISTOR) for 2-bit/cell SONOS Memory Technology
Author :
Choi, Byung Yong ; Park, Byung-Gook ; Lee, Jong Duk ; Shin, Hyungcheol ; Lee, Yong Kyu ; Sung, Suk-Kang ; Lee, Se-Hoon ; Chae, Heesoon ; Lee, Jong Jin ; Bai, Keun Hee ; Kim, Dong-Dae ; Kim, Dong-Won ; Lee, Choong-Ho ; Park, Donggun
Author_Institution :
ISRC & Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ.
Abstract :
In terms of nonvolatile memory device characteristics, the optimal device parameters for the TWISTOR (twin SONOS transistor) structure are investigated. Through this study, we show the best performance of 80nm gate TWISTOR device, which are very promising solution of future 2-bit/cell SONOS technology
Keywords :
integrated memory circuits; semiconductor-insulator-semiconductor devices; 2 bit; 2 bit/cell SONOS memory technology; 80 nm; TWISTOR structure; nonvolatile memory device; optimal device parameters; twin SONOS transistor; Channel hot electron injection; Computer science; Electronic equipment testing; Hot carriers; Nonvolatile memory; Research and development; SONOS devices; Scalability; Semiconductor device testing; Transistors;
Conference_Titel :
Non-Volatile Semiconductor Memory Workshop, 2006. IEEE NVSMW 2006. 21st
Conference_Location :
Monterey, CA
Print_ISBN :
1-4244-0027-9
DOI :
10.1109/.2006.1629500
