Extending endurance of NROM memories to over 10 million program/erase cycles
Author :
Roizin, Yakov ; Pikhay, Evgeny ; Lisiansky, Michael ; Heiman, Alexey ; Alon, Eli ; Aloni, Efraim ; Fenigstein, Amos
fYear :
2006
fDate :
2006
Firstpage :
74
Lastpage :
75
Keywords :
Charge carrier processes; Degradation; Electrodes; Electron traps; High K dielectric materials; Poles and towers; SONOS devices; Substrates; Threshold voltage; Tunneling;
