• DocumentCode
    1904498
  • Title

    Characterization techniques for mixed signal system

  • Author

    Zagursky, V.

  • Author_Institution
    Inst. of Electron. & Comput. Sci., Latvian Univ., Riga, Latvia
  • fYear
    1997
  • fDate
    22-25 Sep 1997
  • Firstpage
    403
  • Lastpage
    407
  • Abstract
    The paper deals with an improved technique for testing mixed signal system (MSS) as the system objects with the dynamic nonlinear and stochastic properties. A proposed technique makes it possible to estimate the dynamic characterization parameters typical as for spectral domain as for histogram testing. The implementation of the testing technique that is described is based on a broadband test signal that simulates actual operating conditions of MSS. By changing mode of the test-signal generation it may be possible to except masking of the signal knocked codes. The technique makes it possible to avoid the standard problems associated with precise estimation of the spectrum of a broadband signal. The proposed technique is well fitted for design for test (DFT) and built in self-test (BIST) schemes to integrated circuits including digital processing unit an on-chip ADC and DAC
  • Keywords
    analogue-digital conversion; automatic test equipment; built-in self test; design for testability; digital-analogue conversion; integrated circuit testing; mixed analogue-digital integrated circuits; BIST; DAC; broadband test signal; built in self-test; design for test; digital processing; dynamic nonlinear properties; estimation; histogram testing; integrated circuits; mixed signal system; on-chip ADC; spectral domain; standard problem; statistical testing; stochastic properties; Automatic testing; Built-in self-test; Circuit testing; Design for testability; Histograms; Integrated circuit testing; Nonlinear dynamical systems; Signal generators; Stochastic systems; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    0-7803-4162-7
  • Type

    conf

  • DOI
    10.1109/AUTEST.1997.633653
  • Filename
    633653