Title :
Diamond fast opening switches for inductive energy storage power modulators
Author :
Gensler, S.W. ; Prasad, R.R. ; Tzonev, I.V. ; Qi, N. ; Krishnan, M.
Author_Institution :
Alameda Appl. Sci. Corp., San Leandro, CA, USA
Abstract :
Summary form only given. Presents experimental results from natural and CVD diamonds used as fast opening switches in prototype IES circuits. The physical and electrical properties of diamond combine to offer a superb electronic material. Diamond has the highest electrical breakdown strength, highest thermal conductivity, highest operating temperature, and best mechanical strength of any solid state switch material (e.g. Si or GaAs). Diamond switches are capable of /spl sim/0.1 kHz operation at /spl sim/0.1-1 MV amplified voltages. Early results with natural Type IIa diamonds indicate /spl sim/0.2-0.5 /spl mu/s conduction times followed by rapid opening with dR/dt values /spl sim/5/spl times/10/sup 10/ /spl Omega//s. Results of experiments at charge voltages up to 10 kV and conduction times up to -1 /spl mu/s will be presented. The power amplification and efficiency of these opening switches will be evaluated in light of several applications such as a 150 kA/150 kV/40 ns compact flash X-ray source, high average power microwave sources, and particle-beam drivers.
Keywords :
diamond; inductive energy storage; modulators; plasma devices; plasma switches; power amplifiers; switches; 0.1 to 1 MV; 0.2 to 0.5 mus; 1 kHz; 1 mus; 10 kV; C; CVD diamond; compact flash X-ray source; diamond fast opening switches; efficiency; electrical breakdown strength; high average power microwave sources; inductive energy storage power modulators; natural Type IIa diamonds; natural diamond; opening switches; particle-beam drivers; power amplification; prototype IES circuits; Conducting materials; Electric breakdown; Energy storage; Prototypes; Solid state circuits; Switches; Switching circuits; Temperature; Thermal conductivity; Voltage;
Conference_Titel :
Plasma Science, 1997. IEEE Conference Record - Abstracts., 1997 IEEE International Conference on
Conference_Location :
San Diego, CA, USA
Print_ISBN :
0-7803-3990-8
DOI :
10.1109/PLASMA.1997.605029