DocumentCode
1904760
Title
Ferroelectrics for non-volatile memories
Author
Cuppens, R. ; Larsen, P.K. ; Spierings, G.A.C.M.
Author_Institution
Philips Research Laboratories, P.O. Box 80.000, 5600 JA Eindhoven, The Netherlands
fYear
1992
fDate
14-17 Sept. 1992
Firstpage
245
Lastpage
252
Abstract
In the late 1980s the interest in ferroelectric materials for memory applications has been renewed on the basis of concepts where ferroelectric thin film capacitors are embedded in Integrated Circuit processes. This paper discusses the application of ferroelectric thin films in memories. First ferroelectric thin film capacitors are reviewed followed by a discussion on the deposition techniques for ferroelectric thin films and on the integration with an IC technology. Next measured data of some important electrical characteristics for non-volatile memories are treated. Finally different ferroelectric memory cell configurations and their consequences on memory characteristics are discussed.
Keywords
Application specific integrated circuits; Capacitors; Electric variables; Electric variables measurement; Ferroelectric materials; Integrated circuit measurements; Integrated circuit technology; Nonvolatile memory; Sputtering; Thin film circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid State Device Research Conference, 1992. ESSDERC '92. 22nd European
Conference_Location
Leuven, Belgium
Print_ISBN
0444894780
Type
conf
Filename
5435177
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