DocumentCode :
1904922
Title :
Breakdown Electric Field Calculation of Hot SF6 and Its Application to High Voltage Circuit Breakers
Author :
Li, Xingwen ; Zhao, Hu ; Jiang, Xu ; Jia, Shenli ; Wang, Qian
Author_Institution :
State Key Lab. of Electr. Insulation & Power Equip., Xi´´an Jiaotong Univ., Xi´´an, China
fYear :
2012
fDate :
23-26 Sept. 2012
Firstpage :
1
Lastpage :
6
Abstract :
The calculation of the critical electric field strength Ecr of hot SF6 is important for a compact circuit breaker design. First, the reduced critical electric field strength (E/N)cr is obtained for 2, 4 and 8atm respectively, and for the temperature range of 300 to 3000K, by solving the Boltzmann equation. Then the variation of Ecr with pressure and temperature is derived from the corresponding (E/N)cr data of SF6. It is found that the pressure effect could not be neglected to predict the Ecr by comparison of the calculation results of Ecr at 8atm using the (E/N)cr data of 8atm and 2atm, where the maximum deviation is above 50%. Finally, the calculation results of Ecr are used to evaluate the dielectric breakdown strength of a puffer type high voltage SF6 circuit breaker by comparing the ratio of applied electric field strength Ea and Ecr. It demonstrates that the analysis results can provide an indicator for the probable breakdown areas inside the arc quenching chamber.
Keywords :
Boltzmann equation; SF6 insulation; circuit breakers; circuit-breaking arcs; electric breakdown; Boltzmann equation; arc quenching chamber; dielectric breakdown strength; hot SF6 breakdown electric field strength calculation; pressure 2 atm; pressure 4 atm; pressure 8 atm; puffer type high voltage circuit breaker design; temperature 300 K to 3000 K; Circuit breakers; Dielectric breakdown; Electric fields; Magnetohydrodynamics; Sulfur hexafluoride; Temperature distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts (Holm), 2012 IEEE 58th Holm Conference on
Conference_Location :
Portland, OR
ISSN :
1062-6808
Print_ISBN :
978-1-4673-0778-9
Type :
conf
DOI :
10.1109/HOLM.2012.6336558
Filename :
6336558
Link To Document :
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