Performance degradation of an LC-tank VCO by impact of digital switching noise

Author

Soens, C. ; Van der Plas, G. ; Wambacq, P. ; Donnay, S.

Author_Institution

IMEC, Belgium

fYear

2004

fDate

21-23 Sept. 2004

Firstpage

119

Lastpage

122

Abstract

In mixed-signal designs, digital switching noise is an important limitation for the analog and RF performance. This paper reports a thorough experimental and analytical study of the impact of digital switching noise on a 3.5 GHz LC-tank voltage controlled oscillator (VCO) in 0.18 μm CMOS. Frequency modulation is recognized as the dominating mechanism behind the impact of digital switching noise in the investigated frequency range (DC to 15 MHz). The dominating coupling path, from the source of noise to the VCO, in this frequency range is via the non-ideal metal ground lines.

Keywords

CMOS integrated circuits; MMIC oscillators; coupled circuits; integrated circuit noise; mixed analogue-digital integrated circuits; voltage-controlled oscillators; 0 Hz to 15 MHz; 0.18 micron; 3.5 GHz; CMOS; LC-tank VCO; VCO performance degradation; digital switching noise; frequency modulation noise; mixed-signal designs; noise source coupling path; nonideal metal ground lines; substrate noise coupling; CMOS technology; Circuit noise; Coupling circuits; Degradation; Frequency modulation; Inductors; Noise generators; Radio frequency; Varactors; Voltage-controlled oscillators;

fLanguage

English

Publisher

ieee

Conference_Titel

Solid-State Circuits Conference, 2004. ESSCIRC 2004. Proceeding of the 30th European

Print_ISBN

0-7803-8480-6

Type

conf

DOI

10.1109/ESSCIR.2004.1356632

Filename

1356632