Title :
Reasonable circuit analysis considering comprehensively reliability and variability
Author :
Kurokawa, Akira ; Watanabe, Manabu ; Hoshi, Masayuki ; Fukase, Masa-aki
Author_Institution :
Grad. Sch. of Sci. & Technol., Hirosaki Univ., Hirosaki, Japan
Abstract :
Circuit design in advanced CMOS technologies brings significant reliability and variability challenges. It is necessary to effectively handle the delay variation caused by various factors. In this paper, we make good use of the reliability models that have been proposed until now and present new models for simple and practical use. Then, we present an approach for circuit analysis that comprehensively considers reliability and variability. It includes time-dependent factors such as time-dependent dielectric breakdown (TDDB), bias temperature instability (BTI), hot-carrier injection (HCI), electromigration (EM), and random telegraph noise (RTN). Finally, in the analysis of a circuit with a gated clock, we demonstrate that analysis considering both reliability and variability is very important.
Keywords :
CMOS integrated circuits; circuit stability; clocks; electric breakdown; electromigration; integrated circuit design; integrated circuit modelling; integrated circuit noise; integrated circuit reliability; random noise; BTI; EM; HCI; RTN; TDDB; advanced CMOS technology; bias temperature instability; circuit analysis; circuit design; circuit reliability model; delay variation; electromigration; gated clock circuit; hot-carrier injection; random telegraph noise; time-dependent dielectric breakdown; variability; Degradation; Human computer interaction; Integrated circuit modeling; Integrated circuit reliability; Logic gates; Optical wavelength conversion; NBTI; circuit simulation; hot carrier; reliability; variability;
Conference_Titel :
Communications and Information Technologies (ISCIT), 2013 13th International Symposium on
Conference_Location :
Surat Thani
Print_ISBN :
978-1-4673-5578-0
DOI :
10.1109/ISCIT.2013.6645865