DocumentCode
1905452
Title
Serial replacement maintenance philosophies and multiple-failure diagnostic strategies: a marriage of multiple-fault integrity and common cause sensibility
Author
Gould, Eric
Author_Institution
DSI Int., Orange, CA, USA
fYear
1997
fDate
22-25 Sep 1997
Firstpage
446
Lastpage
454
Abstract
This paper discusses several methodological considerations associated with the incorporation of serial replacement maintenance philosophies into multiple-failure diagnostic strategies. If the serial replacement of items within isolated ambiguity groups is prioritized using isolation probabilities instead of failure probabilities then the resultant diagnostics are capable of exhibiting both the empirical common sense often attributed to single-fault isolation and the integrity and consistency inherent to multiple-failure diagnostics. Isolation probabilities may also be used to calculate the fault resolution statistics upon which many assessments of testability and diagnostic effectiveness are based. If is important, however, that multiple isolations be simulated for each combination of failed components, both in order to prevent the statistics from being skewed toward primary isolations and to allow the group sizes recorded for serially replaced components to properly reflect the topology of the device or system being diagnosed. The simulation of multiple isolations for each failure combination is also essential for the generation of accurate false removal predictions. Statistics based upon the serial replacement of fault groups isolated by a multiple-failure diagnostic strategy can allow design-phase assessments to more accurately predict the performance of fielded diagnostics, thereby allowing timely measures to be taken to reduce the overall cost of ownership
Keywords
maintenance engineering; failure probabilities; isolation probabilities; multiple-failure diagnostic; multiple-fault integrity; serial replacement maintenance; topology; Costs; Electrical resistance measurement; Logic testing; Power system modeling; Predictive models; Probability; Statistical analysis; Statistics; System testing; Topology;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings
Conference_Location
Anaheim, CA
Print_ISBN
0-7803-4162-7
Type
conf
DOI
10.1109/AUTEST.1997.633658
Filename
633658
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