• DocumentCode
    1905452
  • Title

    Serial replacement maintenance philosophies and multiple-failure diagnostic strategies: a marriage of multiple-fault integrity and common cause sensibility

  • Author

    Gould, Eric

  • Author_Institution
    DSI Int., Orange, CA, USA
  • fYear
    1997
  • fDate
    22-25 Sep 1997
  • Firstpage
    446
  • Lastpage
    454
  • Abstract
    This paper discusses several methodological considerations associated with the incorporation of serial replacement maintenance philosophies into multiple-failure diagnostic strategies. If the serial replacement of items within isolated ambiguity groups is prioritized using isolation probabilities instead of failure probabilities then the resultant diagnostics are capable of exhibiting both the empirical common sense often attributed to single-fault isolation and the integrity and consistency inherent to multiple-failure diagnostics. Isolation probabilities may also be used to calculate the fault resolution statistics upon which many assessments of testability and diagnostic effectiveness are based. If is important, however, that multiple isolations be simulated for each combination of failed components, both in order to prevent the statistics from being skewed toward primary isolations and to allow the group sizes recorded for serially replaced components to properly reflect the topology of the device or system being diagnosed. The simulation of multiple isolations for each failure combination is also essential for the generation of accurate false removal predictions. Statistics based upon the serial replacement of fault groups isolated by a multiple-failure diagnostic strategy can allow design-phase assessments to more accurately predict the performance of fielded diagnostics, thereby allowing timely measures to be taken to reduce the overall cost of ownership
  • Keywords
    maintenance engineering; failure probabilities; isolation probabilities; multiple-failure diagnostic; multiple-fault integrity; serial replacement maintenance; topology; Costs; Electrical resistance measurement; Logic testing; Power system modeling; Predictive models; Probability; Statistical analysis; Statistics; System testing; Topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings
  • Conference_Location
    Anaheim, CA
  • Print_ISBN
    0-7803-4162-7
  • Type

    conf

  • DOI
    10.1109/AUTEST.1997.633658
  • Filename
    633658