• DocumentCode
    1905482
  • Title

    Frequency comb metrology at PHz frequencies: Precision in the extreme ultraviolet

  • Author

    Gohle, Ch ; Kandula, D.Z. ; Pinkert, T.J. ; Morgenweg, J. ; Barmes, I. ; Ubachs, W. ; Eikema, K.S.E.

  • Author_Institution
    LaserLaB Amsterdam, VU Univ., Amsterdam, Netherlands
  • fYear
    2011
  • fDate
    13-20 Aug. 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The capability of frequency-comb (FC) lasers to precisely measure optical frequencies is extended to the multiple-PHz domain. This frequency region, which covers the extreme ultraviolet (XUV, wavelengths shorter than 100 nm), was previously not accessible to these devices. Frequency comb generation is shown for 51-85 nm by amplification and coherent up-conversion of a pair of pulses originating from a near-infrared femtosecond FC laser. Moreover, Ramsey-like signals with up to 61% contrast are observed when the XUV comb is scanned over transitions in argon, neon and helium, resulting in an 8-fold improved determination of the ground state ionization energy of helium.
  • Keywords
    argon; frequency measurement; helium; lasers; measurement by laser beam; neon; Ar; He; Ne; Ramsey-like signals; XUV comb; frequency comb generation; frequency comb metrology; frequency-comb lasers; ground state ionization energy; near-infrared femtosecond FC laser; optical frequency measurement; wavelength 51 nm to 85 nm; Frequency modulation; Helium; Metrology; Ultraviolet sources;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    General Assembly and Scientific Symposium, 2011 XXXth URSI
  • Conference_Location
    Istanbul
  • Print_ISBN
    978-1-4244-5117-3
  • Type

    conf

  • DOI
    10.1109/URSIGASS.2011.6050328
  • Filename
    6050328