Title :
Fretting Behavior of Au Plated Copper Contacts Induced by High Frequency Vibration
Author :
Wanbin Ren ; Li Cui ; Jinbao Chen ; Xiaoming Ma ; Xinyun Zhang
Author_Institution :
Sch. of Electr. Eng. & Autom., Harbin Inst. Of Tech., Harbin, China
Abstract :
Fretting, which induced by high frequency vibration, remains a major cause of connector failure and can impair reliability in aerospace electrical and electronic systems. The test system was developed for high frequency fretting conditions (Maximum vibration frequency 2000Hz) by using electro dynamic shaker in this paper. The fretting behavior of gold plated copper contacts was studied by controlling the fretting frequency and the fretting amplitude. Contact resistance, friction force, and dynamic fretting displacement were recorded explicitly. Surface characteristics of fretted area are also analyzed by SEM/EDX. It is clearly revealed that the contact micro morphology feature, fretting amplitude and frequency are important factors for electrical contact degradation and the failure mechanisms of contacts.
Keywords :
X-ray chemical analysis; avionics; contact resistance; copper alloys; electric connectors; electrical contacts; electrodynamics; failure analysis; gold alloys; scanning electron microscopy; wear; Au-Cu; SEM-EDX; aerospace electrical-electronic systems; connector failure; contact failure mechanisms; contact micromorphology feature; contact resistance; dynamic fretting displacement; electrical contact degradation; electrodynamic shaker; fretting amplitude; fretting behavior; fretting frequency control; friction force; gold plated copper contacts; high frequency fretting conditions; high frequency vibration; impair reliability; surface characteristics; test system; Contact resistance; Copper; Force; Friction; Gold; Surface morphology;
Conference_Titel :
Electrical Contacts (Holm), 2012 IEEE 58th Holm Conference on
Conference_Location :
Portland, OR
Print_ISBN :
978-1-4673-0778-9
DOI :
10.1109/HOLM.2012.6336605
