Using ANOVA in a Microwave Round-Robin Comparison

Author

Barbe, Kurt ; Van Moer, Wendy ; Rolain, Yves

Author_Institution

Dept. ELEC, Vrije Univ. Brussel, Brussels

fYear

2008

fDate

12-15 May 2008

Firstpage

44

Lastpage

48

Abstract

This paper describes a procedure for comparing calibrated nonlinear radio-frequency (RF) measurements performed on a nonlinear device by five different measurement laboratories. The device-under-test is a nonlinear active semiconductor device that is designed to generate a maximum number of harmonic tones. The goal is to obtain a simple, automated method that detects if some laboratory had measurement problems during the measurement campaign. The developed comparison method is based on the analysis of variance (ANOVA) technique.

Keywords

microwave measurement; semiconductor device testing; ANOVA; analysis-of-variance technique; calibrated nonlinear radio-frequency measurements; harmonic tones; microwave round-robin comparison; nonlinear active semiconductor device; Analysis of variance; Distortion measurement; Instruments; Laboratories; Microwave devices; Microwave measurements; Performance evaluation; Radio frequency; Semiconductor device measurement; Testing; ANOVA; microwave measurements; nonlinear measurements;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE

Conference_Location

Victoria, BC

ISSN

1091-5281

Print_ISBN

978-1-4244-1540-3

Electronic_ISBN

1091-5281

Type

conf

DOI

10.1109/IMTC.2008.4547001

Filename

4547001