• DocumentCode
    1906198
  • Title

    Adaptive threshold scheme to operate long on-chip buses at the limit of signal integrity

  • Author

    Katoch, Atul ; Garg, Manish ; Seevinck, Evert ; Veendrick, Hany

  • Author_Institution
    Philips Res. Labs., Eindhoven, Netherlands
  • fYear
    2004
  • fDate
    21-23 Sept. 2004
  • Firstpage
    323
  • Lastpage
    326
  • Abstract
    As the technology scales, on-chip interconnects are becoming more and more narrow while their height is not scaling linearly with their width. This leads to an increase in coupling capacitance with neighbouring wires, resulting in higher crosstalk. It also leads to poor performance due to a sluggish RC response at the receiving end of the wire, which may even result in failure in (very) noisy environments. We propose an adaptive threshold scheme in which the receiver switching thresholds are adjusted according to the detected noise in the bus lines. These noise levels are dependent on both the front-end processing (transistor performance) as well as on the backend processing (metal resistance, capacitance, width and spacing). The circuit technique presented in this paper therefore automatically compensates for the process variations. This technique offers a 29% decrease of the propagation delay for a 10 mm long bus in Metal 2 in a 0.13 μm CMOS technology in low noise conditions. The total range of control spans 75% of the bus delay.
  • Keywords
    CMOS digital integrated circuits; buffer circuits; integrated circuit interconnections; integrated circuit noise; interference (signal); system buses; system-on-chip; threshold logic; 0.13 micron; 10 mm; CMOS; SoC; adaptive threshold scheme; adjustable receiver switching thresholds; backend processing; buffers; bus delay; bus line noise detection; crosstalk; front-end processing; long on-chip buses; metal capacitance; metal resistance; metal spacing; metal width; neighbouring wire coupling capacitance; noisy environments; on-chip interconnects; process variation compensation; signal integrity limits; technology scaling; wire receiving end RC response; Automatic control; CMOS technology; Capacitance; Circuit noise; Crosstalk; Integrated circuit interconnections; Noise level; Propagation delay; Wires; Working environment noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2004. ESSCIRC 2004. Proceeding of the 30th European
  • Print_ISBN
    0-7803-8480-6
  • Type

    conf

  • DOI
    10.1109/ESSCIR.2004.1356683
  • Filename
    1356683