DocumentCode :
1906357
Title :
Modelling of Gate Currents in MOSFETs Operating at Low Drain Voltages
Author :
Chang, M Y ; Dyke, D.W. ; Leung, C C C ; Childs, P.A.
Author_Institution :
School of Electronic & Electrical Engineering, The University of Birmingham, Edgbaston, Birmingham, B15 2TT, England
fYear :
1996
fDate :
9-11 Sept. 1996
Firstpage :
263
Lastpage :
266
Abstract :
A hybrid Monte Carloliterative technique has been used to solve the Boltzmann transport equation including electron-electron interactions. A simple parabolic energy dispersion and a full band structure are separately used to calculate the electron-electron scattering rate. The technique is used to model gate currents in MOSFETs operating at low drain voltages. It found that electron-electron scattering near the drain of the device can quantitatively account for experimental observations ofgate current at low drain voltages.
Keywords :
Boltzmann equation; Charge carrier processes; Distribution functions; Electrons; Hot carriers; Low voltage; MOSFETs; Monte Carlo methods; Phonons; Scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1996. ESSDERC '96. Proceedings of the 26th European
Conference_Location :
Bologna, Italy
Print_ISBN :
286332196X
Type :
conf
Filename :
5435240
Link To Document :
بازگشت