• DocumentCode
    1906357
  • Title

    Modelling of Gate Currents in MOSFETs Operating at Low Drain Voltages

  • Author

    Chang, M Y ; Dyke, D.W. ; Leung, C C C ; Childs, P.A.

  • Author_Institution
    School of Electronic & Electrical Engineering, The University of Birmingham, Edgbaston, Birmingham, B15 2TT, England
  • fYear
    1996
  • fDate
    9-11 Sept. 1996
  • Firstpage
    263
  • Lastpage
    266
  • Abstract
    A hybrid Monte Carloliterative technique has been used to solve the Boltzmann transport equation including electron-electron interactions. A simple parabolic energy dispersion and a full band structure are separately used to calculate the electron-electron scattering rate. The technique is used to model gate currents in MOSFETs operating at low drain voltages. It found that electron-electron scattering near the drain of the device can quantitatively account for experimental observations ofgate current at low drain voltages.
  • Keywords
    Boltzmann equation; Charge carrier processes; Distribution functions; Electrons; Hot carriers; Low voltage; MOSFETs; Monte Carlo methods; Phonons; Scattering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid State Device Research Conference, 1996. ESSDERC '96. Proceedings of the 26th European
  • Conference_Location
    Bologna, Italy
  • Print_ISBN
    286332196X
  • Type

    conf

  • Filename
    5435240