Title :
Simulation of integrated circuit immunity with LECCS model
Author :
Ichikawa, Kouji ; Inagaki, Masashi ; Sakurai, Yukihiko ; Iwase, Isao ; Nagata, Makoto ; Wada, Osami
Author_Institution :
R&D Center, DENSO Corp., Aichi
fDate :
Feb. 27 2006-March 3 2006
Abstract :
We have been developing an LSI model for EMC simulation in electronic control units. EMI simulations have been applied to some units using an LSI EMI model. These models have been called the LECCS Model and ICEM Model, but there are few examples of EMS simulation in printed circuit boards. Therefore , we studied the LSI EMS model and attempted to perform an EMS simulation of a printed circuit board. The LSI was tested through the DPI method (IEC61967-4). The EMS in this test system was analyzed, and the usefulness of this method of analysis was confirmed. The analysis was also applied to a product
Keywords :
electromagnetic compatibility; integrated circuit testing; large scale integration; printed circuit testing; EMC simulation; LECCS model; LSI; electronic control units; integrated circuit immunity; printed circuit boards; test system; Circuit simulation; Circuit testing; Electromagnetic compatibility; Electromagnetic interference; Immunity testing; Integrated circuit modeling; Large scale integration; Medical services; Printed circuits; System testing;
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC-Zurich 2006. 17th International Zurich Symposium on
Conference_Location :
Singapore
Print_ISBN :
3-9522990-3-0
DOI :
10.1109/EMCZUR.2006.214932
