Title :
Modeling RF voltage drop of printed circuit interconnects using a full-wave approach
Author :
Chua, Eng Kee ; See, Kye Yak ; Liu, Zhihong
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Univ.
fDate :
Feb. 27 2006-March 3 2006
Abstract :
Based on the method of moments (MoM) approach, the radio frequency (RF) voltage drop at any two points of printed circuit interconnects is modeled. The proposed modeling method has been validated experimentally with close agreement. The proposed method allows further study of the impact of RF voltage drop of interconnects on circuit functionality as well as EMI performance
Keywords :
electric potential; method of moments; printed circuits; radiofrequency interference; EMI; MoM; full-wave approach; method of moments; modeling RF voltage drop; printed circuit interconnects; radio frequency voltage drop; Dielectric substrates; Electromagnetic interference; Finite difference methods; Flexible printed circuits; High-speed electronics; Integrated circuit interconnections; Moment methods; Printed circuits; Radio frequency; Voltage;
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC-Zurich 2006. 17th International Zurich Symposium on
Conference_Location :
Singapore
Print_ISBN :
3-9522990-3-0
DOI :
10.1109/EMCZUR.2006.214938
