Title :
A system for the characterization of piezoelectric bimorphs as sensors
Author :
Ando, Bruno ; Giannone, Pietro ; Graziani, Salvatore
Author_Institution :
Dipt. di Ing. Elettr., Elettron. e dei Sist., Univ. of Catania, Catania
Abstract :
The possibility of exploiting the dependence of the produced charge on the mechanical stress applied to the piezoelectric materials is very attractive, especially in the field of sensors. In this paper, a solution for the investigation of the sensing properties of a piezoelectric bimorph is discussed along with a characterization tool. An experimental setup, which adopts innovative solutions is presented. The architecture adopted was developed to study the above- mentioned material properties in a well-defined range of deformation and force applied to the device under test. A dedicated software interface was implemented to manage the characterization system and process the acquired data. A general-purpose data acquisition card and instruments usually available in research and educational laboratories were used, thus guaranteeing the low cost feature, easy reproducibility and flexibility.
Keywords :
data acquisition; deformation; piezoelectric devices; sensors; stress effects; data acquisition card; deformation; mechanical stress; piezoelectric bimorph sensors; software interface; Computer architecture; Data acquisition; Instruments; Material properties; Materials testing; Mechanical sensors; Piezoelectric materials; Sensor phenomena and characterization; Sensor systems; Stress; Piezoelectric bimorph; characterization; mechanical properties; sensor;
Conference_Titel :
Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE
Conference_Location :
Victoria, BC
Print_ISBN :
978-1-4244-1540-3
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2008.4547027