Title :
Non Volatile Memories-Status and Emerging Trends
Author :
Melanotte, M. ; Bez, R. ; Crisenza, G.
Author_Institution :
SGS-THOMSON Microelectronics, Central R&D Technology, via C. Olivetti 2, 20041 Agrate Brianza (MI), Italy
Abstract :
Actual scenario and new trends in non volatile memories are presented, considering market, applications, scaling requirements, reliability and manufacturability constrains. EPROM and Flash-EEPROM are particularly reviewed, as the devices better representing speed and density progress, the two leading aspects along non volatile memories (NVM) evolution.
Keywords :
Cost function; EPROM; Economic forecasting; Microelectronics; Military computing; Nonvolatile memory; Read only memory; Reliability engineering; Research and development; Telecommunication computing;
Conference_Titel :
Solid State Device Research Conference, 1991. ESSDERC '91. 21st European
Conference_Location :
Montreux, Switzerland
