• DocumentCode
    1907173
  • Title

    Internal structure and electrical properties of Ge quantum dot in single-electron transistors

  • Author

    Chen, K.H. ; Chen, I.H. ; Li, P.W.

  • Author_Institution
    Dept. of Electr. Eng., Nat. Central Univ., Chungli, Taiwan
  • fYear
    2010
  • fDate
    13-14 June 2010
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    We have developed a simple, manageable, and self-organized manner - thermally oxidizing SiGe nanocavity for precisely controlling Ge quantum dot (QD) number, position, and tunnel path, which is crucial for effective single-electron tunneling devices. The internal structure properties of Ge QDs were systematically characterized. The effectiveness of Ge QD placement is evidenced by high performance Ge QD single electron transistors (SETs), featuring with clear Coulomb staircase and Coulomb-blockade oscillation behaviors at room temperature.
  • Keywords
    Coulomb blockade; Ge-Si alloys; electric properties; elemental semiconductors; germanium; quantum dots; single electron transistors; tunnelling; Coulomb blockade oscillation; Coulomb staircase; Ge; SiGe; electrical properties; internal structure; quantum dot number; single electron transistors; single electron tunneling device; thermally oxidizing nanocavity; tunnel path; Cavity resonators; Electrodes; Logic gates; Quantum dots; Scanning electron microscopy; Silicon germanium; Tunneling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Silicon Nanoelectronics Workshop (SNW), 2010
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    978-1-4244-7727-2
  • Electronic_ISBN
    978-1-4244-7726-5
  • Type

    conf

  • DOI
    10.1109/SNW.2010.5562546
  • Filename
    5562546