DocumentCode
1907173
Title
Internal structure and electrical properties of Ge quantum dot in single-electron transistors
Author
Chen, K.H. ; Chen, I.H. ; Li, P.W.
Author_Institution
Dept. of Electr. Eng., Nat. Central Univ., Chungli, Taiwan
fYear
2010
fDate
13-14 June 2010
Firstpage
1
Lastpage
2
Abstract
We have developed a simple, manageable, and self-organized manner - thermally oxidizing SiGe nanocavity for precisely controlling Ge quantum dot (QD) number, position, and tunnel path, which is crucial for effective single-electron tunneling devices. The internal structure properties of Ge QDs were systematically characterized. The effectiveness of Ge QD placement is evidenced by high performance Ge QD single electron transistors (SETs), featuring with clear Coulomb staircase and Coulomb-blockade oscillation behaviors at room temperature.
Keywords
Coulomb blockade; Ge-Si alloys; electric properties; elemental semiconductors; germanium; quantum dots; single electron transistors; tunnelling; Coulomb blockade oscillation; Coulomb staircase; Ge; SiGe; electrical properties; internal structure; quantum dot number; single electron transistors; single electron tunneling device; thermally oxidizing nanocavity; tunnel path; Cavity resonators; Electrodes; Logic gates; Quantum dots; Scanning electron microscopy; Silicon germanium; Tunneling;
fLanguage
English
Publisher
ieee
Conference_Titel
Silicon Nanoelectronics Workshop (SNW), 2010
Conference_Location
Honolulu, HI
Print_ISBN
978-1-4244-7727-2
Electronic_ISBN
978-1-4244-7726-5
Type
conf
DOI
10.1109/SNW.2010.5562546
Filename
5562546
Link To Document