DocumentCode :
1907207
Title :
A multiphysics computational technique for THz-frequency characterization of semiconductors and metals
Author :
Willis, Keely ; Knezevic, Irena ; Hagness, Susan C.
Author_Institution :
Univ. of Wisconsin-Madison, Madison, WI, USA
fYear :
2011
fDate :
13-20 Aug. 2011
Firstpage :
1
Lastpage :
4
Abstract :
We present a multiphysics computational technique for calculating the THz-frequency conductivity in semiconductors and metals. This novel technique combines the ensemble Monte Carlo (EMC) simulation of carrier transport with the finite-difference time-domain (FDTD) solver of Maxwell´s curl equations and the molecular dynamics (MD) technique for describing short-range Coulomb interactions between particles with finite radii and the exchange interaction between indistinguishable electrons. The calculated complex conductivity of doped bulk silicon shows excellent agreement with experimental data. This work represents the first comprehensive computational technique for THz-regime characterization of materials with relatively high carrier densities.
Keywords :
Coulomb blockade; Maxwell equations; Monte Carlo methods; carrier density; elemental semiconductors; exchange interactions (electron); finite difference time-domain analysis; molecular dynamics method; semiconductor doping; short-range order; silicon; FDTD solver; Maxwell´s curl equations; THz-frequency conductivity; THz-regime characterization; carrier densities; carrier transport; complex conductivity; doped bulk silicon; ensemble Monte Carlo simulation; exchange interaction; finite radii; finite-difference time-domain solver; indistinguishable electrons; metals; molecular dynamics technique; multiphysics computational technique; semiconductors; short-range Coulomb interactions; Conductivity; Electromagnetic compatibility; Finite difference methods; Force; Silicon; Time domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
General Assembly and Scientific Symposium, 2011 XXXth URSI
Conference_Location :
Istanbul
Print_ISBN :
978-1-4244-5117-3
Type :
conf
DOI :
10.1109/URSIGASS.2011.6050397
Filename :
6050397
Link To Document :
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