• DocumentCode
    1907230
  • Title

    A 5-GS/s 4-bit flash ADC with triode-load bias voltage trimming offset calibration in 65-nm CMOS

  • Author

    Junjie Yao ; Jin Liu

  • Author_Institution
    Guangzhou Runxin Inf. Tech. Co., Ltd., Guangzhou, China
  • fYear
    2011
  • fDate
    19-21 Sept. 2011
  • Abstract
    A 5-GS/s 4-bit flash ADC is implemented in 65-nm CMOS. Offset calibration is achieved by digitally adjusting the bias voltages of the triode loads in the preamplifier without introducing additional capacitive loading in the analog path and degrading the high-speed performance. The ADC consumes 34.3 mW from a 1.2-V supply at 5 GS/s, and occupies 0.0828mm2 active area. The ADC achieves 3.93 ENOB with a 2.5-GHz ERBW and a 0.45-pJ/convstep FOM at 5 GS/s.
  • Keywords
    CMOS integrated circuits; UHF integrated circuits; analogue-digital conversion; field effect MMIC; preamplifiers; triodes; CMOS; capacitive loading; flash ADC; frequency 2.5 GHz; power 34.3 W; preamplifier; size 65 nm; triode load bias voltage trimming offset calibration; voltage 1.2 V; Accuracy; CMOS integrated circuits; CMOS technology; Calibration; Frequency measurement; Preamplifiers; Resistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Custom Integrated Circuits Conference (CICC), 2011 IEEE
  • Conference_Location
    San Jose, CA
  • ISSN
    0886-5930
  • Print_ISBN
    978-1-4577-0222-8
  • Type

    conf

  • DOI
    10.1109/CICC.2011.6188616
  • Filename
    6188616