• DocumentCode
    1907287
  • Title

    Automatic Optical Inspection of Micro Drill Bit in Printed Circuit Board Manufacturing Based on Pattern Classification

  • Author

    Duan, Guifang ; Chen, Yen-wei ; Sakekawa, Takeshi

  • Author_Institution
    Grad. Sch. of Engeneering & Sci., Ritsumeikan Univ., Kusatsu
  • fYear
    2008
  • fDate
    12-15 May 2008
  • Firstpage
    279
  • Lastpage
    283
  • Abstract
    Automatic optical inspection (AOI) of micro drill bit becomes more and more important with the rapid expanding of printed circuit board (PCB) manufacturing industry. Distinguished from most traditional manual inspection approach, AOI is time-saving, objective and non contact. In this work, a pattern classification method is proposed for the AOI of micro drill bit in PCB manufacturing, in which three features of drill bit blade are extracted for classification. In order to be independent on the clamp that can guarantee the exact position of drill bit blade for photography, and reduce the cost of the AOI system, an image registration method is used to align the drill bit blade, which can also make the feature extraction much easier. The evaluation result indicates that the approach works well for the AOI of micro drill bit. It is real time, more detailed result providing and low requirement on photographic device.
  • Keywords
    automatic optical inspection; drilling; drilling machines; feature extraction; image registration; printed circuit manufacture; production engineering computing; AOI system; PCB manufacturing; automatic optical inspection; drill bit blade; feature extraction; image registration method; microdrill bit; pattern classification; photographic device; printed circuit board manufacturing industry; Automatic optical inspection; Blades; Clamps; Costs; Image registration; Manufacturing automation; Manufacturing industries; Pattern classification; Photography; Printed circuits; Automatic optical inspection (AOI); classification; feature extraction; image registration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE
  • Conference_Location
    Victoria, BC
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-1540-3
  • Electronic_ISBN
    1091-5281
  • Type

    conf

  • DOI
    10.1109/IMTC.2008.4547046
  • Filename
    4547046