DocumentCode :
1907432
Title :
Statistic characteristics of “current-onset voltage” in scaled MOSFETs analyzed by 8k DMA TEG
Author :
Mizutani, T. ; Kumar, A. ; Tsunomura, T. ; Nishida, A. ; Takeuchi, K. ; Inaba, S. ; Kamohara, S. ; Terada, K. ; Hiramoto, T.
Author_Institution :
Inst. of Ind. Sci., Univ. of Tokyo, Tokyo, Japan
fYear :
2010
fDate :
13-14 June 2010
Firstpage :
1
Lastpage :
2
Abstract :
We report statistic characteristics of a newly found variability component: “current-onset voltage”. It is found that the “current-onset voltage” is hardly correlated with any other parameters such as threshold voltage VTH, transconductance Gm and DIBL. These results indicate that the “current-onset voltage” variability is quite a new type of variation that has never been considered before.
Keywords :
MOSFET; matrix algebra; statistical analysis; DMA TEG; current-onset voltage variability; scaled MOSFET; statistic characteristics; threshold voltage; transconductance; variability component; Correlation; Current measurement; Fluctuations; Gaussian distribution; International Electron Devices Meeting; Resource description framework; Threshold voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon Nanoelectronics Workshop (SNW), 2010
Conference_Location :
Honolulu, HI
Print_ISBN :
978-1-4244-7727-2
Electronic_ISBN :
978-1-4244-7726-5
Type :
conf
DOI :
10.1109/SNW.2010.5562557
Filename :
5562557
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1907432
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