Interference fringes observed in electron emission patterns of a multi-wall carbon nanotube

Author

Hata, K. ; Takakura, A. ; Miura, K. ; Ohshita, A. ; Saito, Y.

Author_Institution

Dept. of Electr. & Electron. Eng., Mie Univ., Tsu, Japan

fYear

2003

fDate

7-11 July 2003

Firstpage

55

Lastpage

56

Abstract

Field electron emission patterns from a MWNT with clean surface exhibit fine structures originating from pentagons located at the tip end. The field emission microscopy (FEM) has resolved six pentagons each of which has a small dark spot in its center. Moreover, the bright streaks have been observed at the boundary regions between adjacent pentagons. By calculations based on the formula of Young´s interference of two beams, Oshima et al. (2002) reported that the observed streaks are interference fringes. In this paper, we show experimental results to prove that the streaks are Young´s interference fringes.

Keywords

carbon nanotubes; electron field emission; C; Young´s interference fringes; Young´s interference method; double slits; electron emission patterns; fine structures; multiwall carbon nanotube; Carbon nanotubes; Chemicals; Electron emission; Flat panel displays; Interference; Mechanical factors; Nanoscale devices; Potential well; Surface cleaning; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Microelectronics Conference, 2003. Technical Digest of the 16th International

Conference_Location

Osaka, Japan

Print_ISBN

4-8181-9515-4

Type

conf

DOI

10.1109/IVMC.2003.1222980

Filename

1222980