Title :
A test platform implementing SPC in a low-volume, high-mix test department
Author :
Stanley, Dennis L. ; Duncan, R.F. ; Smith, Gregory W.
Author_Institution :
Wilcox Electric Inc., Kansas City, MO, USA
Abstract :
The development of a PC-based functional test platform that incorporates Statistical Process Control (SPC) and a failure analysis database is described. With Commercial Off-The-Shelf(COTS) tools available it is possible in a low volume high-mix environment to easily obtain basic statistical information on each test, develop an easily accessible database of information on failures, causes of failures and troubleshooting activities and increase test efficiency with minimal test development costs. A common test platform has been developed that can be configured to test a wide variety of sub-assemblies from digital controller cards to radio frequency (RF) modules. The platform consists of a PC with a multi-function data acquisition card and a General Purpose Interface Bus (GPIB) card for control of test instruments. Applications are linked with Dynamic Data Exchange (DDE) and the PCs are connected to the company´s Local Area Network (LAN) so that test data can be accessed from throughout the plant. A key point is the implementation of SPC with this test platform. Statistics include process capability indices Cp and Cpk and failure rate. Test data is analyzed and used to make process improvements. Examples are presented. Since the entire system has been designed and built around established COTS software and hardware, additional capabilities can be easily added in the future. Some planned enhancements are described
Keywords :
automatic test equipment; automatic testing; computer interfaces; data acquisition; electronic engineering computing; electronic equipment testing; failure analysis; local area networks; microcomputer applications; military equipment; peripheral interfaces; production testing; statistical databases; statistical process control; COTS; DoD; Dynamic Data Exchange; GPIB; General Purpose Interface Bus; LAN; PC; RF modules; SPC; Statistical Process Control; common test platform; digital boards; digital controller cards; failure analysis database; low volume high-mix environment; military equipment; multi-function data acquisition card; test development costs; test efficiency; test platform; troubleshooting; Costs; Data acquisition; Databases; Digital control; Failure analysis; Local area networks; Process control; Radio control; Radio frequency; Testing;
Conference_Titel :
AUTOTESTCON, 97. 1997 IEEE Autotestcon Proceedings
Conference_Location :
Anaheim, CA
Print_ISBN :
0-7803-4162-7
DOI :
10.1109/AUTEST.1997.633687