Title :
LAN-based LXI Instrument Systems- the Next Step in the Evolution of Measurement System Technology
Author :
Burch, Jeff ; Cataldo, Adam ; Eidson, John ; Fernandez, Andrew ; Proft, Conrad ; Vook, Dieter
Author_Institution :
Meas. Res. Lab., Agilent Technol., Inc, Santa Clara, CA
Abstract :
In the field of measurement, many of the leading test and measurement, T&M, companies have formed the LXI Consortium with the explicit goal of specifying an Ethernet-based architecture for T&M instrument systems. This paper explores the LXI architecture and gives performance figures illustrating the benefits of using this architecture.
Keywords :
computerised instrumentation; local area networks; measurement systems; Ethernet; LAN; LXI Consortium; T&M instrument systems; measurement system; Automation; Business; Ethernet networks; Frequency; Instruments; Local area networks; Physical layer; Protocols; System testing; Throughput; GPIB; IEEE 1588; IEEE 488; Instrument architecture; LXI;
Conference_Titel :
Instrumentation and Measurement Technology Conference Proceedings, 2008. IMTC 2008. IEEE
Conference_Location :
Victoria, BC
Print_ISBN :
978-1-4244-1540-3
Electronic_ISBN :
1091-5281
DOI :
10.1109/IMTC.2008.4547068
