DocumentCode
1907797
Title
Plastic ICs for military equipment cost reduction challenge and feasibility demonstration
Author
Brizoux, M. ; Lerose, S. ; Chadebec, G. ; Potage, J. ; Miet, J.M.
Author_Institution
Thomson-CSF, Orsay, France
fYear
1990
fDate
20-23 May 1990
Firstpage
918
Abstract
The authors describe the strategy and the main results of the first phase of a program whose goal is to introduce PICs (plastic integrated circuits) in certain types of military equipment. The first phase of the French Ministry of Defense´s Plastic Component Plan (PCP) has demonstrated the realistic applicability of PICs in military equipment. During the test program, PICs have been able to survive in very severe environmental conditions (such as HAST, or highly accelerated stress test). Failure mechanisms are not related to corrosion alone, and it is obvious that package integrity is a key factor for achieving good component reliability. In addition, a close relationship between package and soldering process for SMDs (surface mounting devices) dictates the need to define a new military standard which takes into account the specificity of plastic SMDs and user constraints
Keywords
circuit reliability; corrosion testing; economics; environmental testing; failure analysis; integrated circuit manufacture; integrated circuit technology; integrated circuit testing; military equipment; packaging; surface mount technology; HAST; Plastic Component Plan; SMD; SMT; component reliability; corrosion; failure mechanisms; highly accelerated stress test; military equipment cost reduction; military standard; package integrity; plastic integrated circuits; severe environmental conditions; soldering process; surface mounting devices; test program; Circuit testing; Corrosion; Costs; Failure analysis; Life estimation; Military equipment; Packaging machines; Plastic packaging; Soldering; Stress;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 1990. ., 40th
Conference_Location
Las Vegas, NV
Type
conf
DOI
10.1109/ECTC.1990.122299
Filename
122299
Link To Document