Title :
Prospects in Silicon Nanoelectronics
Author_Institution :
IMEC, Belgium
fDate :
22-24 September 1997
Keywords :
Germanium silicon alloys; Integrated circuit interconnections; Interference; Lithography; MOSFET circuits; Nanoelectronics; Nanotechnology; Physics; Quantum dots; Silicon germanium;
Conference_Titel :
Solid-State Device Research Conference, 1997. Proceeding of the 27th European
Print_ISBN :
2-86332-221-4
DOI :
10.1109/ESSDERC.1997.194376