DocumentCode :
1908179
Title :
Hysteresis and critical phenomena in silicon on insulator MOSFET´s
Author :
Ouisse, T. ; Ghibaudo, G. ; Brini, J. ; Cristoloveanu, S. ; Borel, G.
Author_Institution :
Thomson-TMS, BP 123, 38521 Saint-Egrÿve Cedex, France
fYear :
1991
fDate :
16-19 Sept. 1991
Firstpage :
349
Lastpage :
352
Abstract :
An analytical model is proposed to account for the floating body effects in silicon on insulator MOSFET´s. It enables a quantitative description of the hysteresis effects in the static characteristics and explains the correlation between the conductance and transconductance. Experimental data illustrate the occurrence of the negative conductance/transconductance and suggest that a critical phenomenon comparable to a second order phase transition takes place.
Keywords :
Analytical models; Capacitance; Equations; Hysteresis; Insulation; Microelectronics; Semiconductor device modeling; Silicon on insulator technology; Threshold voltage; Transconductance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid State Device Research Conference, 1991. ESSDERC '91. 21st European
Conference_Location :
Montreux, Switzerland
Print_ISBN :
0444890661
Type :
conf
Filename :
5435311
Link To Document :
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