Title :
Finite transverse coherent length of electron source evaluated by interference fringes with a natural bi-prism
Author :
Yajima, A. ; Kobayashi, W. ; Ichimura, T. ; Cho, B. ; Oshima, C.
Author_Institution :
Dept. of Appl. Phys., Waseda Univ., Tokyo, Japan
Abstract :
In this paper, multi-walled carbon nanotubes (MWCNT) can play the role of biprism interferometer in projection microscopy (PM). The biprism interference patterns are analyzed in order to obtain information on the properties of the source, such as the effective source size, the transverse coherence width.
Keywords :
carbon nanotubes; electron field emission; interference; C; biprism interference patterns; biprism interferometer; effective source size; electron source; finite transverse coherent length; interference fringes; multiwalled carbon nanotubes; projection microscopy; transverse coherence width; Carbon dioxide; Coherence; Electric potential; Electron microscopy; Electron sources; Interference; Iron; Magnetic materials; Materials science and technology; Physics;
Conference_Titel :
Vacuum Microelectronics Conference, 2003. Technical Digest of the 16th International
Conference_Location :
Osaka, Japan
Print_ISBN :
4-8181-9515-4
DOI :
10.1109/IVMC.2003.1223006
