Title :
Field electron emission from high-T/sub c/ superconductors
Author :
Takano, I. ; Yamashita, T. ; Mogami, Y. ; Moriyama, T. ; Mashita, Y. ; Oshima, C. ; Hatano, T.
Author_Institution :
Dept. of Appl. Phys., Waseda Univ., Tokyo, Japan
Abstract :
In this paper, field electron emission from Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8+/spl delta// (Bi2212) whiskers, one of the high-T/sub c/ superconductors, was investigated. The Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8+/spl delta// whiskers (T/sub c/=75 K) were grown by annealing Bi/sub 3/Sr/sub 2/Ca/sub 2/Cu/sub 4/O/sub x/ plate at 844/spl deg/C for 120 hours at Po/sub 2/=0.72 bar in airtight conditions.
Keywords :
annealing; bismuth compounds; calcium compounds; electron field emission; high-temperature superconductors; strontium compounds; whiskers (crystal); 0.72 bar; 120 hour; 844 degC; Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8+/spl delta// whiskers; Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8/; annealing; field electron emission; high temperature superconductors; Annealing; Electron emission; Iron; Materials science and technology; Niobium; Numerical analysis; Scanning electron microscopy; Superconductivity; Surface cleaning; Voltage;
Conference_Titel :
Vacuum Microelectronics Conference, 2003. Technical Digest of the 16th International
Conference_Location :
Osaka, Japan
Print_ISBN :
4-8181-9515-4
DOI :
10.1109/IVMC.2003.1223007
