Title :
EMI analysis of TFT-LCD driver IC
Author :
Choi, Sung-Pil ; Kwon, Jae Wook ; Chang, Kye Eon ; Kim, Jin Tae ; Han, Min Koo
Author_Institution :
LSI Res., Samsung Electron. Co. Ltd.
fDate :
Feb. 27 2006-March 3 2006
Abstract :
In this paper, design for EMC of LCD driver IC is proposed. By the analysis with package parasitic parameters and EMC test pattern, local power/ground noise in LCD driver IC simulated. As a result of analysis, design for lower peak of EMI spectrum and design for lower mean level of that is proposed at the same time. In addition, decoupling cap with CMOS process can decrease EMI spectrum without any further mask. The analysis of the proposed design shows that LCD driver IC can be alternatives for TFT-LCD EMC solution. It is because LCD driver IC is nearly irrelevant to LCD module whereas source PCB should be redesigned separately according to the size and resolution of LCD panel. The experimental result shows that the proposed design methodology for LCD driver IC can successfully decrease EMI spectrum of LCD module
Keywords :
CMOS integrated circuits; driver circuits; electromagnetic compatibility; electromagnetic interference; CMOS process; EMC; EMI analysis; EMI spectrum; TFT-LCD driver IC; decoupling cap; Analytical models; CMOS process; Design methodology; Electromagnetic compatibility; Electromagnetic interference; Integrated circuit modeling; Integrated circuit noise; Integrated circuit packaging; Integrated circuit testing; Pattern analysis;
Conference_Titel :
Electromagnetic Compatibility, 2006. EMC-Zurich 2006. 17th International Zurich Symposium on
Conference_Location :
Singapore
Print_ISBN :
3-9522990-3-0
DOI :
10.1109/EMCZUR.2006.215007