Title :
Statisitcal Analysis for IC-Management
Author :
Axelrad, Valery E. ; Kibarian, John K.
Author_Institution :
PDF Solutions, USA
fDate :
22-24 September 1997
Keywords :
Design methodology; Electronics industry; Integrated circuit interconnections; Integrated circuit manufacture; Integrated circuit modeling; Manufacturing industries; Manufacturing processes; Process design; Product development; Semiconductor device manufacture;
Conference_Titel :
Solid-State Device Research Conference, 1997. Proceeding of the 27th European
Print_ISBN :
2-86332-221-4
DOI :
10.1109/ESSDERC.1997.194391
